发明名称 MEASURING DEVICE FOR SCATTERING OF X-RAYS AT SMALL ANGLE
摘要 PURPOSE:To reduce the size over the entire part of a titled device by making the X-rays from an X-ray source incident to asymmetrically cut crystals, reflecting the X-rays at specific reflection angles by the crystals and making the X- rays incident to a sample. CONSTITUTION:The 1st crystal C1 which is channel cut or single cut is disposed between an X-ray source 21 and a sample 23. The X-rays 22 made incident to the sample 23 through the crystal C1 emerge from the sample 23 as scattered X-rays. The scattered X-rays are made incident to a detector 24 by providing the 2nd crystal C2 which is channel cut or single cut between the sample 23 and the detector 24. Since the intensity of the X-rays to be detected increases, asymmetrical reflection is used for the 1st crystal C1 and the 2nd crystal C2.
申请公布号 JPS5895253(A) 申请公布日期 1983.06.06
申请号 JP19810193434 申请日期 1981.11.30
申请人 SHIMAZU SEISAKUSHO KK 发明人 ISHIDA HIDENOBU
分类号 G01N23/203;G01N23/201 主分类号 G01N23/203
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