| 摘要 |
The disclosed calibrated ASV measurement apparatus provides accurate measurements of the ASV (apparent surface voltage) on a photoconductive imaging medium using a relatively low cost, commercially available ASV probe. To obtain accurate ASV measurements, the probe sensitivity (relating probe voltgage output to sensed potential) is periodically recalibrated to compensate for changes in environmental and electrical conditions. The calibration function is implemented using a calibration target mounted directly to the housing of the probe's sensing head so as to occupy a portion of the probe's sensing field. During periodic calibration intervals, when the ASV probe is responsive only to potentials on the calibration target, known potentials are applied to the calibration target, and an indication of a change in probe sensitivity with respect to the calibration target is calculated and used to recalibrate the value for probe sensitivity used in ASV measurement. During periodic ASV measurement intervals (with the calibration target at ground potential), the ASV probe is exposed to a reference ground and to the ASV on the imaging medium to obtain a differential probe voltgage, and this differential voltage is translated using the calibrated probe sensitivity into the desired ASV measurement relative to the reference ground. For a preferred embodiment, the periodic ground reference potential is provided by a grounded seam on the surface of the electrophotographic drum, such that separate means for that purpose are not required to be provided as part of the ASV probe. |
