METHOD AND DEVICE FOR DETERMINING ORIENTATION OF CRYSTAL

摘要

Apparatus and method for determining the orientation of a crystal uses the Laue diffraction pattern of X-rays back-scattered from the surface layers of the crystal. To enable the use of a real time X-ray detector, the X-ray beam (12) and the detector axis (22) are arranged at an oblique angle to the surface (13). The detector output is used in a computer to determine the angle of the crystal.