发明名称 INSPECTING METHOD FOR INTERNAL LAYER CIRCUIT
摘要 PURPOSE:To improve the precision and efficiency of inspection by inspecting residual copper and an abnormal part by mounting an insulating thin plate, having opening holes except at circuits on an internal layer material, at a prescribed position, and then bringing terminal sides of a connector having many terminals into contact with the plate. CONSTITUTION:On an internal layer material 2 such as a copper lamination plate, etc., having electric circuits 1, an insulating thin plate 4 of a sheet of polyvinyl chloride resin, etc., having opening holes 3 except at the circuits is mounted at a prescribed position, and the terminal sides of a connector 6 having many terminals 5 is brought into contact with the insulating thin plate 4. Then, if residual copper or foreign matter such as a whisker and a burr resides on a part other than the circuits, a short circuit is formed, thereby knowing abnormality by the lighting of a lamp 7 and the sounding of a signal tone generator 8 such as a buzzer, a bell, etc. This method inspects an internal layer circuit not visually, but electrically, so that the precision and performance of the inspection are improved remarkably.
申请公布号 JPS57163875(A) 申请公布日期 1982.10.08
申请号 JP19810050407 申请日期 1981.04.02
申请人 MATSUSHITA DENKO KK 发明人 KUBO KAZUHIRO;KITAGAWA YOSHIFUMI
分类号 G01R31/02 主分类号 G01R31/02
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