发明名称 INSPECTING DEVICE FOR CIRCUIT ELEMENT
摘要 PURPOSE:To inspect circuit elements such as diodes and the like without cutting off a circuit, by inspecting a circuit in parallel connection of inductance elements and diodes via an operational amplifier and maximum and minimum value detecting circuit. CONSTITUTION:A circuit to be inspected in parallel connection with an inductance element of an inductance L and a diode 5 is connected with an output of an operational amplifier 3 and an its inverting input terminal, and a trapezoidal pulse from a pulse generating circuit 1 via a resistor R1 is applied to the inverting input terminal. Thus, as a current (i) flowing to the resistor R1 is increased/ decreased with time, a voltage V2 based on EquationIis outputted from the amplifier 3 (in Equation, VF is a forward voltage of the diode 5). When the output voltage is detected at a positive/negative peak voltage detection circuits 8, 9 which are controlled switchingly, a specified detected output is produced from a voltage measuring device 11 only at normal state, allowing to inspect circuit elements such as diodes without cutting off the circuit.
申请公布号 JPS57103068(A) 申请公布日期 1982.06.26
申请号 JP19800179801 申请日期 1980.12.19
申请人 FUJITSU KK 发明人 TATENO HARUNOBU;UCHIDA KENJI;WADA KAZUHIKO
分类号 G01R31/00;G01R31/26;G01R31/28 主分类号 G01R31/00
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