发明名称 |
TESTING DEVICE FOR DIODE |
摘要 |
|
申请公布号 |
JPS5670477(A) |
申请公布日期 |
1981.06.12 |
申请号 |
JP19790149049 |
申请日期 |
1979.11.14 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
KAMITAKI YUUJI |
分类号 |
G01R31/26;H01L21/66 |
主分类号 |
G01R31/26 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
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