发明名称 Apparatus for testing the size and the spacings of silicon crystals in Al-Si alloys
摘要 An apparatus for testing the size and the spacings of silicon crystals in Al-Si alloys comprises a housing; a horizontal guide accommodated in the housing, and a pointed scanning needle secured by a spring device to the horizontal guide with constant feed. The needle is arranged to scan a surface of a workpiece to be tested with a predetermined force and has applied thereto an electrical voltage which upon contacting an aluminum section of the workpiece transmits a voltage applied to the workpiece to a voltmeter, but partially or entirely interrupts same upon contacting a silicon crystal.
申请公布号 US4255703(A) 申请公布日期 1981.03.10
申请号 US19790012426 申请日期 1979.02.15
申请人 FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. 发明人 DUTSCHKE, WOLFGANG
分类号 G01N27/04;(IPC1-7):G01R27/02;G01N27/00 主分类号 G01N27/04
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