发明名称 |
Apparatus for testing the size and the spacings of silicon crystals in Al-Si alloys |
摘要 |
An apparatus for testing the size and the spacings of silicon crystals in Al-Si alloys comprises a housing; a horizontal guide accommodated in the housing, and a pointed scanning needle secured by a spring device to the horizontal guide with constant feed. The needle is arranged to scan a surface of a workpiece to be tested with a predetermined force and has applied thereto an electrical voltage which upon contacting an aluminum section of the workpiece transmits a voltage applied to the workpiece to a voltmeter, but partially or entirely interrupts same upon contacting a silicon crystal.
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申请公布号 |
US4255703(A) |
申请公布日期 |
1981.03.10 |
申请号 |
US19790012426 |
申请日期 |
1979.02.15 |
申请人 |
FRAUNHOFER-GESELLSCHAFT ZUR FOERDERUNG DER ANGEWANDTEN FORSCHUNG E.V. |
发明人 |
DUTSCHKE, WOLFGANG |
分类号 |
G01N27/04;(IPC1-7):G01R27/02;G01N27/00 |
主分类号 |
G01N27/04 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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