发明名称 AUTOMATIC TEST LOGIC UNIT
摘要 PURPOSE:To improve the function of diagnosing a fault happening to a unit itself and also to make it possible to find the fault in its early stage even when a logic function increases in scale, by making a diagnosis by dividing a logic circuit on a constant scale into individual small-unit logic circuits. CONSTITUTION:The logic circuit is divided into small-unit logic circuits 201-204 and memory element groups 101-103 are provided among the logic circuits to remember temporarily outputs of circuits 201-203 in a diagnosis. In the circuit constitution to diagnose circuit 203, the output of ROM301 stored with the correct value of circuit 203 propagates through signal line 503 and the output of element group 103 propagates through signal line 504 and is input to dissidence detecting circuit 401 for comparison, the output of which is output to signal line 801 by way of logic circuit 701. Similaly, in the constitution to diagnose circuit 202, dissidence detecting circuit 402 compares the output of ROM302 to that of element group 102 and sends its output from signal line 801 by way of circuit 701.
申请公布号 JPS569848(A) 申请公布日期 1981.01.31
申请号 JP19790084163 申请日期 1979.07.03
申请人 NIPPON ELECTRIC CO 发明人 TAKASAKI SHIGERU
分类号 G01R31/28;G06F11/22 主分类号 G01R31/28
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