发明名称 |
METHOD FOR PROCESSING PLASMA |
摘要 |
A plasma processing method is provided to perform a plasma curing process on a photoresist mask pattern by using a plasma state of a gas including nitrogen. A plurality of layers are stacked on a semiconductor substrate(206). A process target having a photoresist mask pattern(201) is installed on the layers. In a plasma processing method using a plasma etching apparatus, a curing process is performed to reduce concavo-convex parts of a surface and a side of the photoresist mask pattern by forming a plasma state of a gas including nitrogen and performing a plasma-curing process on the photoresist mask pattern. A plasma ashing process for the layers under the photoresist mask pattern is performed by using the photoresist mask pattern having the reduced concavo-convex parts.
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申请公布号 |
KR20080067584(A) |
申请公布日期 |
2008.07.21 |
申请号 |
KR20080004388 |
申请日期 |
2008.01.15 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORPORATION |
发明人 |
YASUI NAOKI;WATANABE SEIICHI |
分类号 |
H01L21/3065 |
主分类号 |
H01L21/3065 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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