发明名称 PLATING DEVICE
摘要 PROBLEM TO BE SOLVED: To swiftly and securely find the heavy failure of the sealability in a seal member, and further, to securely find an extremely trace amount of a leak beforehand or after that.SOLUTION: A first stage leak test where the inside of an internal space formed at the inside of a substrate holder 18 in such a manner that, when the substrate is held with the substrate holder 18, the same is sealed with seal members 66, 68 is evacuated, and whether the internal space reaches a prescribed vacuum pressure after a fixed time is tested is performed, and a second stage leak test where the internal space is sealed, and whether the pressure at the inside of the internal space changes to a prescribed value or higher within a prescribed time is tested is performed, and using the substrate holder 18 passed through the second leak test, the substrate is subjected to plating treatment at a plating tank 34.SELECTED DRAWING: Figure 9
申请公布号 JP2016135923(A) 申请公布日期 2016.07.28
申请号 JP20160034555 申请日期 2016.02.25
申请人 EBARA CORP 发明人 MINAMI YOSHIO;FUJIKATA JUNPEI;KISHI TAKASHI
分类号 C25D21/12;C25D17/06;C25D17/08;H01L21/288;H01L21/683 主分类号 C25D21/12
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