发明名称 |
Process for forming metal and metal silicide films |
摘要 |
In the past a film of a transition metal silicide or an aluminum silicon alloy has been deposited on a semiconductor substrate by vacuum evaporation and used as an electrode or wiring of a semiconductor device. According to the present invention, the film is produced by a sputtering method wherein the silicon component of the film is not supplied from the target but from a gaseous silicon compound contained in the sputtering atmosphere.
|
申请公布号 |
US4218291(A) |
申请公布日期 |
1980.08.19 |
申请号 |
US19790015896 |
申请日期 |
1979.02.28 |
申请人 |
VLSI TECHNOLOGY RESEARCH ASSOCIATION |
发明人 |
FUKUYAMA, TOSHIHIKO;YANAGISAWA, SHINTARO |
分类号 |
C23C14/00;H01L21/28;H01L21/285;(IPC1-7):C23C15/00 |
主分类号 |
C23C14/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|