发明名称 Process for forming metal and metal silicide films
摘要 In the past a film of a transition metal silicide or an aluminum silicon alloy has been deposited on a semiconductor substrate by vacuum evaporation and used as an electrode or wiring of a semiconductor device. According to the present invention, the film is produced by a sputtering method wherein the silicon component of the film is not supplied from the target but from a gaseous silicon compound contained in the sputtering atmosphere.
申请公布号 US4218291(A) 申请公布日期 1980.08.19
申请号 US19790015896 申请日期 1979.02.28
申请人 VLSI TECHNOLOGY RESEARCH ASSOCIATION 发明人 FUKUYAMA, TOSHIHIKO;YANAGISAWA, SHINTARO
分类号 C23C14/00;H01L21/28;H01L21/285;(IPC1-7):C23C15/00 主分类号 C23C14/00
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