| 摘要 |
<p>A tester for electronic circuits comprises a control/data processing unit having outputs connected to electronic testing boards each corresponding to a lead of the circuit to be tested. Each testing board includes four switch networks and an output switch network all of which are controlled by a network which, in turn, is controlled by an output of the control/data processing unit. Buffer amplifiers receive inputs from the control/data processing unit directly and also via residual voltage compensation networks serially connected with switch networks, and have feedback paths including switch networks and provide outputs to the inputs of the output switch network. Relay switches are controlled by the control/data processing unit selectively to connect a load to a lead, to connect a comparison network between lead and the control/data processing unit, etc. By appropriate programming of the control/data processing unit different operating modes of the testing boards can be selected for performing different kinds of tests on a device or circuit connected to the leads.</p> |
