发明名称 INSPECTING METHOD OF ALUMINA SUBSTRATES
摘要 PURPOSE:To provide a method of making effective and simple inspection by disposing an alumina substrate between a light source and a photo detector and inspecting the mechanical intensity of the substrate from the transmittancy of the substrate. CONSTITUTION:Light source 1 of a mercury arc lamp of the inspecting device radiates parallal rays of an even and high illuminance. An actinometer or lux meter 2 which has a photo detector 4 for measuring the quantity of light of the light source 1 and the quantity of transmitted light of an alumina substrate 3 is provided. The light source 1, substrate 3 and photo detector 4 are so fixed that their distances become constant. First, the substrate 3 is removed, and the quantity of the light of the light source 1 is received in the photo detector 4 and is read with the actinometer 2. The reading is let to be L1. Next, the substrate 3 is set to a base 5 and the quantity of light L2 having transmitted through the substrate 3 is read with the actinometer 2. Hence, by obtaining the transmittancy L2/L1, the mechanical strength of the substrate 3 may be checked. The particle sizes, gloss, surface roughness, etc. of the substrate may be checked by the simple method of measuring the transmittancies and the mechanical strength of the substrate may be thereby inspected.
申请公布号 JPS5462884(A) 申请公布日期 1979.05.21
申请号 JP19770129977 申请日期 1977.10.28
申请人 FUJITSU LTD 发明人 KOBAYASHI MASAHIRO;YOSHIDA SHINJI;SHIRAKAWA TATSUO
分类号 G01N21/59;G01N21/25 主分类号 G01N21/59
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