| 摘要 |
The present disclosure describes an improved integrated circuit chip which includes in addition to the logic circuits for performing its design function, an additional circuit for providing a unique reference pattern in digital form useful for test purposes. This reference pattern is automatically read by the tester and gives information as to the type of chip and its final signature. The former indicates to the tester an appropriate test routine such as a pseudo-random binary sequence; and the latter, the predetermined digital pattern which will be present on all of the input and output terminals of a properly functioning integrated circuit chip at the conclusion of the test. Since each chip signature is read by the tester itself, no reference to signatures customarily recorded in tables or inscribed on circuit schematics is required by the test technician.
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