| 摘要 |
<p>A circuit for testing the switching properties of semiconductor components built into circuits uses an oscillograph with two earthed deflector connections. By allowing in circuit testing it reduces the cost of fault finding and repair. A step down transformer has its secondary connected to a measurement circuit and two further tappings. The voltage between the measurement circuit tapping and the first further tapping has a larger alternating voltage amplitude than that between measurement circuit and second further tappings. Both further tappings are resistively shunted to earth and the voltage on that of the second further tapping is used as a deflection voltage. The semiconductor element is connected between measurement circuit tapping and earth, parallel to a resistive network providing the second deflector voltage.</p> |
