发明名称 Apparatus for measuring holographic lens aberration parameters
摘要 An instrument for measuring various and sundry parameters that are analogous to the aberrations that may exist in holographic lenses and other energy diffraction apparatus is disclosed as containing: a laser energy source; a pair of masks for controlling precisely the path of the light from said laser energy source, so that it may be used as a reference parameter; a rotatable mounting table for holding the holographic lens being tested in an appropriate position in the path of said reference laser light path; a microscope positioned to receive predetermined laser light rays that have been diffracted by the holographic lens being tested; indicia to measure the X, Y and Z axes distances between that point on the holographic lens being tested where the aforesaid laser light path passes therethrough and a given point position on or with respect to said microscope; and a support bench upon which all of the aforesaid elements may be mounted, so that their respective relative positions may be controlled in such manner that they form a unique geometrical configuration and combination.
申请公布号 US4077721(A) 申请公布日期 1978.03.07
申请号 US19760715740 申请日期 1976.08.19
申请人 THE UNITED STATES OF AMERICA AS REPRESENTED BY THE SECRETARY OF THE NAVY 发明人 MOHON, WINDELL N.
分类号 G02B5/32;(IPC1-7):G01B9/00 主分类号 G02B5/32
代理机构 代理人
主权项
地址