摘要 |
An instrument for measuring various and sundry parameters that are analogous to the aberrations that may exist in holographic lenses and other energy diffraction apparatus is disclosed as containing: a laser energy source; a pair of masks for controlling precisely the path of the light from said laser energy source, so that it may be used as a reference parameter; a rotatable mounting table for holding the holographic lens being tested in an appropriate position in the path of said reference laser light path; a microscope positioned to receive predetermined laser light rays that have been diffracted by the holographic lens being tested; indicia to measure the X, Y and Z axes distances between that point on the holographic lens being tested where the aforesaid laser light path passes therethrough and a given point position on or with respect to said microscope; and a support bench upon which all of the aforesaid elements may be mounted, so that their respective relative positions may be controlled in such manner that they form a unique geometrical configuration and combination.
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