发明名称 |
METHOD OF ANALYZING NONCONDUCTIVE SPECIMEN BY PHOTOELECTRON POLARIZING METHOD AND PLATE FOR HOLDING SPECIMEN |
摘要 |
The method consists in subjecting a sample of insulating material to photon radiation and in measuring the energy of the photoelectrons emitted by the sample under the action of the radiation. The sample is fixed on a metal sample-holder having a shape such that a portion of this latter is subjected to radiation. The emission of electrons of low energy is thus initiated and the positive charges which appear at the surface of the samples with the emitted electrons are neutralized by creating in the vicinity of the sample surface a space zone in which the electric field is substantially zero. |
申请公布号 |
JPS5277792(A) |
申请公布日期 |
1977.06.30 |
申请号 |
JP19760153289 |
申请日期 |
1976.12.20 |
申请人 |
COMMISSARIAT A L*ENERGIE ATOMIQUE |
发明人 |
RUSETSUTO FUEBU;REMI FUONTEN |
分类号 |
G01N23/227 |
主分类号 |
G01N23/227 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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