发明名称 |
PHASE TRANSITION MEMORY DEVICE |
摘要 |
<p><P>PROBLEM TO BE SOLVED: To provide a phase transition RAM with a memory cell structure having the advantage of being readily increased in integration and in capacity. <P>SOLUTION: The phase transition RAM comprises a pair of access transistors having respective drain regions and a phase transition material film electrically connected to a bit line through a first electrode, electrically connected to the drain regions through a pair of second electrodes, and shared by the access transistors. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p> |
申请公布号 |
JP2004363586(A) |
申请公布日期 |
2004.12.24 |
申请号 |
JP20040156583 |
申请日期 |
2004.05.26 |
申请人 |
SAMSUNG ELECTRONICS CO LTD |
发明人 |
OH HYUNG-ROK;CHO HAKUKO;KIM DU-EUNG;CHO WOO-YEONG |
分类号 |
G11C13/00;G11B7/24;G11C11/56;G11C16/02;H01L27/10;H01L27/105;H01L27/24;H01L29/76;H01L45/00;H01L47/00;(IPC1-7):H01L27/10 |
主分类号 |
G11C13/00 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|