发明名称 PHASE TRANSITION MEMORY DEVICE
摘要 <p><P>PROBLEM TO BE SOLVED: To provide a phase transition RAM with a memory cell structure having the advantage of being readily increased in integration and in capacity. <P>SOLUTION: The phase transition RAM comprises a pair of access transistors having respective drain regions and a phase transition material film electrically connected to a bit line through a first electrode, electrically connected to the drain regions through a pair of second electrodes, and shared by the access transistors. <P>COPYRIGHT: (C)2005,JPO&NCIPI</p>
申请公布号 JP2004363586(A) 申请公布日期 2004.12.24
申请号 JP20040156583 申请日期 2004.05.26
申请人 SAMSUNG ELECTRONICS CO LTD 发明人 OH HYUNG-ROK;CHO HAKUKO;KIM DU-EUNG;CHO WOO-YEONG
分类号 G11C13/00;G11B7/24;G11C11/56;G11C16/02;H01L27/10;H01L27/105;H01L27/24;H01L29/76;H01L45/00;H01L47/00;(IPC1-7):H01L27/10 主分类号 G11C13/00
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