| 摘要 |
PURPOSE:To efficiently perform analysis without requiring any complicated external test pattern control. CONSTITUTION:The built-in ROM 1 of this microcomputer is constituted of a user ROM area 6 for writing a user program and test ROM area 5 for writing the program of the microcomputer itself. A program counter 2 controls not only the execution address of the ROM 1, but also always outputs values to a comparator circuit 7. The circuit 7 always compares the value of a module register 8 in which data can be set from the outside of the microcomputer through a port 10 with the value of the counter 2 and, when both values coincide with each other, requests an interruption control circuit 3 to issue an interruption having priority higher than that given to interruptions at the time of ordinary using mode. Upon receiving the interruption, a vector address generation circuit 4 generates the start address of the test ROM area 5 and sets the address in the program counter 2. |
