发明名称 LABEL FOR INDICATING DEFECT OF MASK FILM AND ITS STICKING DEVICE
摘要 <p>PURPOSE:To obtain a label and its sticking device by which the defect of a pattern is rapidly and accurately corrected by indicating the defect of the pattern formed on a mask film and the defect information thereof. CONSTITUTION:The label L where a position indicating mark A for indicating the position of the defect of the pattern of the mask film MF is printed at an optional position is stuck to the defect spot of the pattern of the mask film MF. By sticking the label L at a position corresponding to the defect of the pattern of the mask film MF in the unit of specified distance dimension Y, the defect position is accurately indicated by the mark A printed corresponding to a position obtained by subdividing the distance dimension, and the structure of a label sticking device is simplified.</p>
申请公布号 JPH05333520(A) 申请公布日期 1993.12.17
申请号 JP19920158936 申请日期 1992.05.27
申请人 ASAHI OPTICAL CO LTD 发明人 OKUYAMA TAKASHI
分类号 B65C9/26;G03F1/00;G09F3/00;G09F3/10;H01L21/027 主分类号 B65C9/26
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