Anordnung zur Pruefung der Beanspruchung von Schaltern,申请号DE19651516245-传众专利搜索

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发明名称	Anordnung zur Pruefung der Beanspruchung von Schaltern
摘要
申请公布号	DE1516245(A1)	申请公布日期	1969.06.12
申请号	DE19651516245	申请日期	1965.03.16
申请人	SIEMENS AG	发明人	HAUW-HIAN TAN,DIPL.-ING.
分类号	G01R31/333	主分类号	G01R31/333
代理机构		代理人
主权项
地址

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