发明名称 MEASURING METHOD OF CHANGE OF STATE
摘要 PURPOSE:To improve the measuring accuracy of an apparatus by processing the transmitted optical analog signals after converting the same to electric analog signals. CONSTITUTION:A detecting circuit 3 when detecting the state change of an object 1 to be measured outputs a detecting signal corresponding to the state change. An electric/optical analog converter circuit 4 converts the change of the detecting signals which are electric analog signals to strong or weak of optical analog signals and outputs the same to an optical fiber 5. The optical analog signals transmitted through the optical fiber 5 reach an optical/electric analog converter circuit 7 of a signal processing stage 6 without being influenced by the electromagnetic induction of electric signals in each part within the measuring apparatus. The optical/electric analog converter circuit 7 changes and outputs the output voltage corresponding to the intensity of the input optical analog signals. A signal processor circuit 8 starts to process the signal when receiving the signal of the output voltage. Accordingly, the detecting signal output from the detecting circuit 3 can be transmitted to the signal processing circuit 8 without being influenced by electric signals within the measuring apparatus, so that the measuring accuracy is improved.
申请公布号 JPH0372220(A) 申请公布日期 1991.03.27
申请号 JP19890207964 申请日期 1989.08.14
申请人 NEC CORP 发明人 SAITO TSUKASA
分类号 G01D21/00;G01R19/00;H04B10/00;H04B10/2507 主分类号 G01D21/00
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