发明名称 Method and system for fabricating and cleaning free-standing nanostructures
摘要 Systems and methods include introducing a semiconductor wafer into a process chamber. An etching chemistry is injected into the process chamber to etch a patterned layer and to release free-standing nanostructures on the semiconductor wafer. The etching chemistry includes a supercritical or liquid carbon dioxide fluid and an etching solution. The semiconductor wafer is rinsed by flooding a supercritical or liquid carbon dioxide fluid into the process chamber. The semiconductor wafer is dried by venting out supercritical or liquid carbon dioxide fluid from the process chamber.
申请公布号 US2006194404(A1) 申请公布日期 2006.08.31
申请号 US20060325631 申请日期 2006.01.05
申请人 DUPONT AUDREY;HOYER RONALD 发明人 DUPONT AUDREY;HOYER RONALD
分类号 H01L21/20 主分类号 H01L21/20
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