发明名称 X-RAY SPECIMEN TABLE AND USING METHOD THEREOF
摘要 PURPOSE:To provide a specimen table by which refracted X-rays from a specimen can be easily measured by providing an opening at one section of the outer circumference of a vessel and a specimen holding mechanism in it. CONSTITUTION:An X-ray bulb 1, goniometer 2, solar slits 3, specimen table 4, semiconductor detector 5, amplifier 6, multiplex wave height analyser 7, interface 8, pump or electromagnetic valve 9, calculation unit 10 and an operating board 11 are provided. All the information and instructions such as the conditions of specimen corrosion, conditions of refracted X-rays measurement are communicated through the operating board 11 and carried out as shown by the solid lines and broken lines in the figure. In other words, the continuous X-rays from the X-ray bulb 1 is made parallel by the solar slit 3 and directed to a specimen on the specimen table, and the refracted X-ray is detected through the solar slit 3 and converted into an electric signal. This signal is amplified by the amplifier 6, and changed into energy spectrum by the multiplex wave height analyser 7, and at the same time the signal is counted until a specified time, and the results of counting are stored in the calculation unit through the interface 10, and printed out on X-Y plotter of the calculation unit at a desired time.
申请公布号 JPS5835448(A) 申请公布日期 1983.03.02
申请号 JP19810134422 申请日期 1981.08.27
申请人 SHIN NIPPON SEITETSU KK 发明人 YANO MITSURU;OKAMOTO MASAYUKI
分类号 G01N23/20;G01N23/207 主分类号 G01N23/20
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