Length-of-the-curve stress metric for improved characterization of computer system reliability

摘要

Embodiments of the present invention provide a system that characterizes the reliability of a computer system. The system first collects samples of a performance parameter from the computer system. Next, the system computes the length of a line between the samples, wherein the line includes a component which is proportionate to a difference between values of the samples and a component which is proportionate to a time interval between the samples. The system then adds the computed length to a cumulative length variable which can be used to characterize the reliability of the computer system.