发明名称 Methods of fabricating integrated circuit transistors by simultaneously removing a photoresist layer and a carbon-containing layer on different active areas
摘要 Integrated circuit transistors may be fabricated by simultaneously removing a photoresist layer on a first active area of an integrated circuit substrate and a carbon-containing layer on a second active area of the integrated circuit substrate, to expose a nitride stress-generating layer on the second active area. A single mask may be used to define the second active area for removal of the photoresist layer on the first active area and for implanting source/drain regions into the second active area.
申请公布号 US2007099126(A1) 申请公布日期 2007.05.03
申请号 US20050266024 申请日期 2005.11.03
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 CHANG CHONG K.;ZHUANG HAOREN;LIPINSKI MATTHIAS;MISHRA SHAILENDRA;KWON O S.;TJOA TJIN T.;KO YOUNG G.
分类号 G03F7/26 主分类号 G03F7/26
代理机构 代理人
主权项
地址