发明名称 |
VARIABLE CAPACITANCE SEMICONDUCTOR DEVICE AND CAPACITANCE CONTROL METHOD USING THE SAME, AND ELECTRONIC EQUIPMENT MOUNTING VARIABLE CAPACITANCE SEMICONDUCTOR DEVICE |
摘要 |
PROBLEM TO BE SOLVED: To provide a variable capacitance semiconductor device having a high capacitance accumulated charge on a small surface area on a substrate.SOLUTION: A buried electrode part 20 on which an oxide film 24 is formed, is buried in an impurity range 26 formed in a semiconductor substrate part 10, an any DC voltage is applied between the buried electrode part 20 and the semiconductor substrate part 10 by a voltage application part 30, 32 to accumulate charge amount corresponding to the applied DC voltage on a charge accumulation part 40 formed inside the oxide film 24 and form a variable capacitance semiconductor device 100.SELECTED DRAWING: Figure 1 |
申请公布号 |
JP2016134432(A) |
申请公布日期 |
2016.07.25 |
申请号 |
JP20150006811 |
申请日期 |
2015.01.16 |
申请人 |
RICOH CO LTD |
发明人 |
YONEDA KAZUHIRO;WATANABE HIROBUMI;NEGORO TAKAAKI;AISU KATSUHIKO;UEDA KEITOKU;NAKATANI YASUKAZU;ONO KATSUYUKI |
分类号 |
H01L21/822;H01L27/04;H01L27/146;H03H7/06 |
主分类号 |
H01L21/822 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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