发明名称 VARIABLE CAPACITANCE SEMICONDUCTOR DEVICE AND CAPACITANCE CONTROL METHOD USING THE SAME, AND ELECTRONIC EQUIPMENT MOUNTING VARIABLE CAPACITANCE SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a variable capacitance semiconductor device having a high capacitance accumulated charge on a small surface area on a substrate.SOLUTION: A buried electrode part 20 on which an oxide film 24 is formed, is buried in an impurity range 26 formed in a semiconductor substrate part 10, an any DC voltage is applied between the buried electrode part 20 and the semiconductor substrate part 10 by a voltage application part 30, 32 to accumulate charge amount corresponding to the applied DC voltage on a charge accumulation part 40 formed inside the oxide film 24 and form a variable capacitance semiconductor device 100.SELECTED DRAWING: Figure 1
申请公布号 JP2016134432(A) 申请公布日期 2016.07.25
申请号 JP20150006811 申请日期 2015.01.16
申请人 RICOH CO LTD 发明人 YONEDA KAZUHIRO;WATANABE HIROBUMI;NEGORO TAKAAKI;AISU KATSUHIKO;UEDA KEITOKU;NAKATANI YASUKAZU;ONO KATSUYUKI
分类号 H01L21/822;H01L27/04;H01L27/146;H03H7/06 主分类号 H01L21/822
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