| 摘要 |
PROBLEM TO BE SOLVED: To provide an appearance inspection device for inspecting the appearance of an inspection target region of a rectangular-parallelepiped-shaped electronic component while suppressing an increase in processing time.SOLUTION: An appearance inspection device 10 for inspecting the appearances of inspection target regions 15, 16 of a rectangular-parallelepiped-shaped electronic component 11 includes: first and second imaging means 12, 13 for respectively imaging different portions of the inspection target regions 15, 16; and optical path adjustment means 14 for changing a light traveling direction to place the inspection target regions 15, 16 into at least one of a first image 12a imaged by the first imaging means 12 and a second image 13a imaged by the second imaging means 13.SELECTED DRAWING: Figure 1 |
