发明名称 SUBSTRATE HOLDING MEANS
摘要 PROBLEM TO BE SOLVED: To provide a wafer holding means which can suppress generation of slip. SOLUTION: The position of a wafer 200 is fixed by providing a gas passage 290 in a boat 217, providing gas blow-out ports 281, 282 communicating with the gas passage at a position where gas is to be blown against the bottom side of the wafer 200 and at a position where gas is to be blown against the bottom surface peripheral edge of the wafer 200 or against at least one of upper and side surfaces of the wafer 200, causing the wafer 200 to float from the boat 217 by blowing gas from the blow-out port 281 against the bottom surface of the wafer, blowing gas from the blow-out port against the bottom surface peripheral edge of the wafer 200 stronger than the central part of the wafer 200, or blowing gas from the blow-out port 282 against at least one of the upper and side surfaces of the wafer 200 substrate. COPYRIGHT: (C)2005,JPO&NCIPI
申请公布号 JP2004363499(A) 申请公布日期 2004.12.24
申请号 JP20030162881 申请日期 2003.06.06
申请人 HITACHI KOKUSAI ELECTRIC INC 发明人 TAKAISHI KENJI;TAKEDA TOMOHIKO;KANEKO TAKASHI
分类号 H01L21/683;H01L21/22;H01L21/31;H01L21/324;H01L21/68;(IPC1-7):H01L21/68 主分类号 H01L21/683
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