发明名称 |
Spring-based probe pin that allows kelvin testing |
摘要 |
The voltage at a node of an integrated circuit can be measured or controlled using a two-wire kelvin contact with spring-based probe pins by offsetting and tapering the lower end section of the spring-based probe pin. As a result, multiple spring-based probe pins can be connected to a single contact bump, such as a solder bump.
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申请公布号 |
US7271606(B1) |
申请公布日期 |
2007.09.18 |
申请号 |
US20050197916 |
申请日期 |
2005.08.04 |
申请人 |
NATIONAL SEMICONDUCTOR CORPORATION |
发明人 |
TANG TZE KANG;CHONG SEK HOI;GAN CHIN CHAI;TAN HAI CHING |
分类号 |
G01R31/02;G01R27/08;G01R31/28 |
主分类号 |
G01R31/02 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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