发明名称 DEFECT INSPECTION UNIT, RADIATION DETECTOR, AND DEFECT INSPECTION METHOD
摘要 PROBLEM TO BE SOLVED: To provide a defect inspection unit, a radiation detector and a defect inspection method capable of detecting a defect pixel due to break of a wiring.SOLUTION: An X-ray detector 1 has a defect inspection unit 100 which acquires plural dark images corresponding to different detection times (imaging time) in a state that X-ray is not irradiated, and calculates differences among pixel images in plural dark images. As for an area where the calculated difference in pixel images is smaller than a predetermined value, the defect inspection unit 100 determines that a defect pixel due to a wiring break is included, and transmits a piece of information relevant to the position of the defect pixel to a storage 44a.SELECTED DRAWING: Figure 2
申请公布号 JP2016134776(A) 申请公布日期 2016.07.25
申请号 JP20150008414 申请日期 2015.01.20
申请人 TOSHIBA CORP;TOSHIBA ELECTRON TUBES & DEVICES CO LTD 发明人 TAKI NAOTERU
分类号 H04N5/367;G01T1/20;H01L27/14;H01L27/144;H01L27/146 主分类号 H04N5/367
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