发明名称 Method of fabricating a thin film transistor using dual or multiple gates
摘要 A method of fabricating a TFT using dual or multiple gates, and a TFT having superior characteristics and uniformity by providing a method of fabricating a TFT using dual or multiple gates by calculating the probability including Nmax, the maximum number of crystal grain boundaries in active channel regions according to the length of the active channels, and adjusting a gap between the active channels capable of synchronizing the number of the crystal grain boundaries in each active channel region of the TFT using the dual or multiple gates in the case where Gs, the size of crystal grains of polycrystalline silicon forming a TFT substrate, theta angle in which "primary" crystal grain boundaries are inclined at a direction perpendicular to an active channel direction of the gates, the width of the active channels and the length of the active channels are determined.
申请公布号 US7482179(B2) 申请公布日期 2009.01.27
申请号 US20060329030 申请日期 2006.01.11
申请人 SAMSUNG SDI CO., LTD. 发明人 LEE KI YONG
分类号 G01R31/26;H01L21/336;H01L21/66;H01L21/77;H01L21/8234;H01L29/04;H01L29/786 主分类号 G01R31/26
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