发明名称 SELECTIVE INSTRUCTION BREAKPOINT GENERATION
摘要 A method includes generating (304) an instruction address value in response to an instruction source event (302). The method further includes selectively generating (314) a breakpoint request based on the instruction source event and responsive to a comparison of the instruction address value to a breakpoint address value. In one embodiment, selectively generating a breakpoint request includes comparing the instruction source event to an instruction source event type, comparing the instruction address value to a breakpoint address value, and generating the breakpoint request responsive to a match between the first instruction source event type and the instruction source event and a match between the instruction address value and the breakpoint address value.
申请公布号 WO2007112162(A3) 申请公布日期 2008.09.12
申请号 WO2007US62532 申请日期 2007.02.22
申请人 FREESCALE SEMICONDUCTOR INC.;MOYER, WILLIAM C. 发明人 MOYER, WILLIAM C.
分类号 G06F9/00;G06F11/00 主分类号 G06F9/00
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