MICROFORCE MEASURING APPARATUS

摘要

PROBLEM TO BE SOLVED: To provide a microforce measuring apparatus which changes little in sensitivity and zero point. SOLUTION: A cantilevered microforce measuring apparatus includes: a cantilever 11 serving as a straining element; a strain sensor 12 integrally formed between the fixed point of the cantilever 11 and a measuring point for a measurement force F at the same time that the cantilever 11 is formed, for detecting the strain of the cantilever 11 and converting it into an electric signal; and a stress concentrating part 13 provided at the part of the cantilever 11 where the strain sensor 12 is placed to allow stresses on the cantilever 11 to concentrate thereon.