发明名称 SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor device capable of suppressing a decrease in breakdown voltage.SOLUTION: A semiconductor device comprises a first semiconductor region 2 of a first conductivity type, a second semiconductor region 3 of a second conductivity type, a first insulating layer 11, and a first insulating region 12. The second semiconductor region 3 is provided on the first semiconductor region 2. The first insulating layer 11 is in contact with the second semiconductor region 3. The first insulating layer 11 also surrounds at least a part of the first semiconductor region 2 and at least a part of the second semiconductor region 3. The first insulating region 12 surrounds at least a part of the first insulating layer 11.SELECTED DRAWING: Figure 2
申请公布号 JP2016171267(A) 申请公布日期 2016.09.23
申请号 JP20150051579 申请日期 2015.03.16
申请人 TOSHIBA CORP 发明人 OKUMURA HIDEKI;TSUCHIYA MASANOBU;MISAWA HIROTO;EZAKI AKIRA;SHIRAISHI TATSUYA
分类号 H01L29/06;H01L21/329;H01L21/336;H01L29/739;H01L29/78;H01L29/861;H01L29/868 主分类号 H01L29/06
代理机构 代理人
主权项
地址