发明名称 |
DATA PROCESSOR AND DATA PROCESSING METHOD |
摘要 |
PROBLEM TO BE SOLVED: To provide a data processor and a data processing method for carrying out the display of feature quantities wherein the classification of defects extracted by a visual inspection device is facilitated. SOLUTION: This data processor receives defect inspection information including at least coordinates of a plurality of defects transmitted from the visual inspection device for extracting the defects of a sample via a communication circuit, and defect review information including at least feature quantities transmitted from a review device for acquiring the image of the defects and imparting the feature quantities of the defect to it via a communication circuit, and displays a graph region whose axes expressing at least two among the feature quantities, and the defects are displayed at the positions according to the imparted feature quantities in the graph region. COPYRIGHT: (C)2008,JPO&INPIT
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申请公布号 |
JP2008227028(A) |
申请公布日期 |
2008.09.25 |
申请号 |
JP20070061183 |
申请日期 |
2007.03.12 |
申请人 |
HITACHI HIGH-TECHNOLOGIES CORP |
发明人 |
ABE CHIKAKO;SUGAWARA HITOSHI;FUNAKOSHI TOMOHIRO |
分类号 |
H01L21/66;G01N21/956;G06T1/00 |
主分类号 |
H01L21/66 |
代理机构 |
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