| 摘要 |
PROBLEM TO BE SOLVED: To provide a semiconductor device in which the presence or absence of breaking of a rewire can be inspected.SOLUTION: In a semiconductor device in which a semiconductor chip is mounted, the semiconductor chip containing an output transistor for converting an input voltage to a first voltage and outputting the first voltage, the semiconductor chip comprises a first electrode pad connected to the output terminal of the output transistor, and a second electrode pad connected to the output terminal through an internal resistor. The semiconductor device has a first penetrating electrode and a rewire which connect the first electrode pad and an external terminal of the semiconductor device, and a second penetrating electrode for connecting the second electrode pad and the rewire. The semiconductor chip has an error amplifier for controlling the output transistor so as to generate an error voltage between the first voltage and a negative feedback voltage and converting an input voltage to a first voltage on the basis of the error voltage, and a switching unit for selectively outputting any one of a second voltage at the first electrode pad and a third voltage at the second electrode pad as a negative feedback voltage to the error amplifier.SELECTED DRAWING: Figure 5 |
