Scanning systems

摘要

The present application discloses methods and systems for scanning an object. The scanning system provides a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm. The second detector region is arranged to receive radiation that has passed through the first detector region. The method includes irradiating the object with radiation having having a peak energy of at least 1 MeV, and detecting the first profile radiation after it has interacted with or passed through the object in order to provide information relating to the object.

主权项

1. A scanning method for scanning an object comprising:
providing a first detector region having a thickness of at least 2 mm and a second detector region having a thickness of at least 5 mm wherein the second detector region is arranged to receive radiation that has passed through the first detector region; irradiating the object with a first high energy radiation profile; detecting the first high energy profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the first high energy profile radiation comprises:
detecting the first high energy profile radiation at the first detector region;receiving the first high energy profile radiation that has passed through the first detector region at the second detector region;detecting the first high energy profile radiation at the second detector region; irradiating the object with a second low energy radiation profile detecting the second low energy profile radiation after it has interacted with or passed through the object in order to provide information relating to the object, wherein detecting the second low energy profile radiation comprises:
detecting the second low energy profile radiation at the first detector region;receiving the second low energy profile radiation that has passed through the first detector region at the second detector region;detecting the second low energy profile radiation at the second detector region; wherein the first detector region is positioned between the object and the second detector region; and calculating a ratio, (A/B)1/(A/B)2 in order to determine information relating to the object based upon said ratio, wherein A is indicative of an amount of radiation detected at the first detector region, B is indicative of an amount of radiation detected at the second detector region, (A/B)1 is a ratio of the first high energy profile radiation detected at the first detector region relative to first high energy profile radiation detected at the second detector region, and (A/B)2 is a ratio of the second low energy profile radiation detected at the first detector region relative to second low energy profile radiation detected at the second detector region.