发明名称 OVERHEAT PROTECTION CIRCUIT AND SEMICONDUCTOR INTEGRATED CIRCUIT DEVICE USING THE SAME AND VEHICLE
摘要 PROBLEM TO BE SOLVED: To provide an overheat protection circuit capable of preventing malfunction when a negative current is applied to the output end of a monitored power element.SOLUTION: An overheat protection circuit has an NPN transistor Q1, a power supply terminal 1 on which a power supply voltage Vis applied, a transmission path for transmitting the power supply voltage Vto the collector of the NPN transistor Q1 from the power supply terminal 1 not through a current source, and an output voltage generating section (an operational amplifier 3, a buffer 4) generating an output voltage Vdepending on the base-emitter voltage of the NPN transistor Q1.SELECTED DRAWING: Figure 1
申请公布号 JP2016213981(A) 申请公布日期 2016.12.15
申请号 JP20150096464 申请日期 2015.05.11
申请人 ROHM CO LTD 发明人 YUKI HIROFUMI;TAKAHASHI SHUNTARO
分类号 H02H5/04;H01L21/822;H01L27/04 主分类号 H02H5/04
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