发明名称 CHEMICAL VAPOR DEPOSITION METHOD USING PLASMA CHEMICAL VAPOR DEPOSITION DEVICE
摘要 PURPOSE: A chemical vapor deposition method using plasma chemical vapor deposition device is provided to reduce the thickness difference between various films formed on plural semiconductor substrates. CONSTITUTION: The present invention discloses a chemical vapor deposition method using plasma chemical vapor deposition device comprising: an input step sequentially inputting plural semiconductor substrates within a plasma chemical vapor deposition device; a step performing CVD process using plasma reaction gas on the respective semiconductor substrate according to the sequence; an output step sequentially outputting the respective semiconductor substrate which the CVD process is performed in toward outside of the plasma CVD device; a cleaning step cleaning the inside of the plasma CVD device by using plasma etching gas; the first purge step firstly purging the inside of the plasma CVD device by using purge gas; a pumping step pumping the gas within the CVD device toward outside; and the secondary purge step purging the inside of the plasma CVD device by using purge gas.
申请公布号 KR20000009263(A) 申请公布日期 2000.02.15
申请号 KR19980029540 申请日期 1998.07.22
申请人 SAMSUNG ELECTRONICS CO, LTD. 发明人 KIM, HO SIK;NAH, KWAN CHOOL
分类号 H01L21/205;(IPC1-7):H01L21/205 主分类号 H01L21/205
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