发明名称 |
CHEMICAL VAPOR DEPOSITION METHOD USING PLASMA CHEMICAL VAPOR DEPOSITION DEVICE |
摘要 |
PURPOSE: A chemical vapor deposition method using plasma chemical vapor deposition device is provided to reduce the thickness difference between various films formed on plural semiconductor substrates. CONSTITUTION: The present invention discloses a chemical vapor deposition method using plasma chemical vapor deposition device comprising: an input step sequentially inputting plural semiconductor substrates within a plasma chemical vapor deposition device; a step performing CVD process using plasma reaction gas on the respective semiconductor substrate according to the sequence; an output step sequentially outputting the respective semiconductor substrate which the CVD process is performed in toward outside of the plasma CVD device; a cleaning step cleaning the inside of the plasma CVD device by using plasma etching gas; the first purge step firstly purging the inside of the plasma CVD device by using purge gas; a pumping step pumping the gas within the CVD device toward outside; and the secondary purge step purging the inside of the plasma CVD device by using purge gas.
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申请公布号 |
KR20000009263(A) |
申请公布日期 |
2000.02.15 |
申请号 |
KR19980029540 |
申请日期 |
1998.07.22 |
申请人 |
SAMSUNG ELECTRONICS CO, LTD. |
发明人 |
KIM, HO SIK;NAH, KWAN CHOOL |
分类号 |
H01L21/205;(IPC1-7):H01L21/205 |
主分类号 |
H01L21/205 |
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