发明名称 VISUAL FUNCTION EXAMINATION SYSTEM AND EXAMINATION METHOD
摘要 PROBLEM TO BE SOLVED: To provide an examination system examining a visual function including depth perception.SOLUTION: As a first examination, this visual function examination system displays a visual target having a characteristic part and a prescribed thickness such that the characteristic part moves from an inner part to this side or from this side to the inner part relatively to a view line direction of a subject while the characteristic part has a prescribed angle to a perpendicular plane of the view line direction of the subject. As a second examination, the visual function examination system fixes a position of a first visual target, and displays a second visual target such that the second visual target moves from an inner part to this side or from this side to the inner part relatively to the view line direction of the subject.
申请公布号 JP2013208190(A) 申请公布日期 2013.10.10
申请号 JP20120079229 申请日期 2012.03.30
申请人 NIKON CORP 发明人 SHINOMIYA TAKASHI;MIYAKE NOBUYUKI
分类号 A61B3/08;A61B3/028 主分类号 A61B3/08
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