发明名称 SEMICONDUCTOR RECTIFYING DEVICE
摘要 PROBLEM TO BE SOLVED: To provide a semiconductor rectifying device which is capable of being prevented from deteriorating its breakdown voltage by restraining a leakage current when a reverse bias voltage is applied while restraining an on-state resistance from increasing when a forward vias voltage is applied. SOLUTION: A Schottky electrode 50 is located between adjacent field alleviating layers 40. The electrode includes a first region 50B that is formed coming into contact with the surface of a drift layer 30, and a second region 50A which is the area of the Schottky electrode 50 excluding the first region 50B. The first region 50B is formed of conductive material whose barrier height is higher than that of the second region 50A. COPYRIGHT: (C)2008,JPO&INPIT
申请公布号 JP2007324218(A) 申请公布日期 2007.12.13
申请号 JP20060150266 申请日期 2006.05.30
申请人 TOSHIBA CORP 发明人 MIZUKAMI MAKOTO;SUZUKI TAKUMA
分类号 H01L29/47;H01L29/872 主分类号 H01L29/47
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