发明名称 SUPERCRITICAL FLUID-BASED CLEANING COMPOSITIONS AND METHODS
摘要 Compositions and methods employing supercritical fluids, e.g., supercritical carbon dioxide, for removal of unwanted material from microelectronic device structures and process equipment. One composition of such type, having utility for removing flux and solder perform surface films, includes supercritical fluid, e.g., supercritical CO<SUB>2</SUB>, and organic co-solvent, e.g., xylene. Another composition of such type having utility for removal of metals, metal oxides, metal-containing post-etch residues and CMP particles from semiconductor substrates includes supercritical fluid and at least one ß-diketone.
申请公布号 WO2004102621(A3) 申请公布日期 2006.08.31
申请号 WO2004US13750 申请日期 2004.05.04
申请人 ADVANCED TECHNOLOGY MATERIALS, INC.;ROEDER, JEFFREY F.;BAUM, THOMAS, H.;HEALY, MATTHEW;XU, CHONGYING 发明人 ROEDER, JEFFREY F.;BAUM, THOMAS, H.;HEALY, MATTHEW;XU, CHONGYING
分类号 B08B3/00;B08B3/04;C11D1/00;C11D3/02;C11D3/16;C11D3/18;C11D3/20;C11D3/24;C11D3/28;C11D3/43;C11D7/02;C11D7/24;C11D7/26;C11D7/28;C11D7/32;C11D7/50;C11D11/00;D06L1/00;G03F7/42 主分类号 B08B3/00
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