发明名称 INSPECTION SYSTEM
摘要 An inspection system includes: a sheet material that is attached to a surface of a pipe and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; a reader that is mounted to an ultrasonic probe and reads the two-dimensional patterns; and a calculation unit that acquires position data on the pipe based on the two-dimensional patterns read by the reader. The inspection system associates the position data with a flaw detection result obtained from a detection result based on the ultrasonic probe.
申请公布号 US2016231284(A1) 申请公布日期 2016.08.11
申请号 US201615134686 申请日期 2016.04.21
申请人 IHI CORPORATION 发明人 SHIINA Eisuke;HAMANO Toshiaki;SHIMOMURA Takuya
分类号 G01N29/04;G01B17/00 主分类号 G01N29/04
代理机构 代理人
主权项 1. An inspection system that includes an ultrasonic probe that is freely moved on a pipe, and irradiates the pipe with an ultrasonic wave to detect a reflected wave, and a calculation unit that executes arithmetic processing based on a detection result based on the ultrasonic probe to acquire a flaw detection result of the pipe, the inspection system comprising: a sheet material attached to a surface of the pipe, and has two-dimensional patterns drawn thereon that are arranged on the pipe and indicate positions on the pipe; and a reader mounted to the ultrasonic probe and reads the two-dimensional patterns, wherein the calculation unit acquires position data on the pipe based on the two-dimensional patterns read by the reader, and associates the position data with the flaw detection result obtained from the detection result based on the ultrasonic probe.
地址 Tokyo JP