发明名称 |
Integrated circuits with hold time avoidance circuitry |
摘要 |
Integrated circuits with logic circuitry are provided. The logic circuitry may be organized into logic regions. Each logic region may include a multiplexer, a flip-flop, a logic circuit, etc. The flip-flop may have an input that is connected to an output of the multiplexer. The multiplexer may have a first input connected to an output of the flip-flop in an adjacent logic region. The multiplexer may have a second input connected to the logic circuit. The logic regions may be connected in a chain. The flip-flops may be controlled by first and second control signals. The second control signal may be a delayed version of the first control signal. The multiplexer may be controlled by the second control signal. The flip-flops may include master and slave latches. The master latch is controlled by the first control signal while the slave latch is controlled by the first and second control signals. |
申请公布号 |
US8866527(B1) |
申请公布日期 |
2014.10.21 |
申请号 |
US201012753834 |
申请日期 |
2010.04.02 |
申请人 |
Altera Corporation |
发明人 |
Lewis David |
分类号 |
H03K3/289;H03K3/012 |
主分类号 |
H03K3/289 |
代理机构 |
Treyz Law Group |
代理人 |
Treyz Law Group ;Tsai Jason |
主权项 |
1. Circuitry, comprising:
first and second flip-flops operable as part of a scan chain in a scan mode and operable in a normal operational mode, wherein each of the first and second flip-flops comprises:
a master level-sensitive latch having a master input that serves as an input for the first and second flip-flops and having a master output; anda slave level-sensitive latch having a slave input coupled to the master output and having a slave output that serves as an output for the first and second flip-flops; and control circuitry operable to generate first control signals for the master level-sensitive latch and the slave level-sensitive latch of the first and second flip-flops during the scan mode and operable to generate second control signals for the master level-sensitive latch and the slave level-sensitive latch of the first and second flip-flops during the normal operational mode, wherein the second control signals are different than the first control signals, wherein the first controls signals comprise a first clock signal and a second clock signal that is delayed version of the first clock signal, wherein the master level-sensitive latch of the first flip-flop is operable to receive the first clock signal at a first point in time, wherein the master level-sensitive latch of the second flip-flop is operable to receive the first clock signal at a second point in time that occurs a clock skew delay following the first point in time, wherein the slave level-sensitive latch of the first flip-flop is operable to receive the second clock signal that is delayed with respect to the first clock signal by a delay period that is greater than the clock skew delay. |
地址 |
San Jose CA US |