CONTACT PROBE AND ELECTRICAL CONNECTION DEVICE INCLUDING THE SAME

摘要

PROBLEM TO BE SOLVED: To provide a contact probe capable of maintaining high productivity and low cost while stabilizing electrical connection and having a high degree of freedom in spring setting, and a semiconductor element socket including the same.SOLUTION: A contact probe 100 includes a first plunger 120, a second plunger 110 and a coil spring 130. The second plunger 110 comprises: a substrate connection part 111 formed by pressing a sheet material and contacted with a substrate 1701; a slide connection part 113 relatively slidably arranged while electrically contacting with the first plunger 120; and a flange part 112. The substrate connection part 111 comprises: contact points 111a and 601a flatly formed in the tip; a semi-conical shape part 111b worked in a conical shape narrowed toward the contact points and cut into a half; and a columnar part 111c gradually connected with the semi-conical shape part 111b.SELECTED DRAWING: Figure 1