| 摘要 |
PROBLEM TO BE SOLVED: To provide a profile measuring system and its method, capable of accurately obtaining the profile of an object. SOLUTION: The profile measuring system comprises a signal generator 11 for generating transmission pulses, a transmission antenna A<SB>1</SB>emitting transmission pulses in a space, a receiving antenna A<SB>2</SB>and a signal receiving part 12 receiving the transmission pulse of object reflection in the emission position of the transmission pulse, a correlation part 131 for obtaining a plurality of correlation waveforms from a plurality of reception signals obtained by changing the position of the transmitting antenna A<SB>1</SB>to the object and emitting transmission pulses and reference signals, a pseudo-wave front extraction part 132 for extracting pseudo-wave front based on the correlation waveforms, a profile estimation part 133 for estimating an object profile from the correlation between the pseudo-wave front and the object profile, and a waveform estimation part 134 for estimating a reception signal waveform according to the estimated object profile. The system uses at first transmission pulse waveform as a reference signal waveform and the estimated reception signal waveform is used, after the next and the object profile has been obtained by estimating the object profile a plurality of number of times. COPYRIGHT: (C)2007,JPO&INPIT
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