发明名称 Method for measuring characteristics of sample
摘要 A method for measuring characteristics of a sample is provided. The method includes the following steps: obtaining an interference spectrum of the sample; transforming the interference spectrum into a temporal interference signal via a Fourier transform, in which the temporal interference signal includes a plurality of coherence wave packets; separating the wave packets; transforming the wave packets into a plurality of interface interference signals via an inverse Fourier transform; and fitting a plurality of factors of the interface interference signals into a model for obtaining the refractive indexes, the extinction coefficients, and a thickness of the sample.
申请公布号 US9494410(B2) 申请公布日期 2016.11.15
申请号 US201314097246 申请日期 2013.12.05
申请人 NATIONAL TAIWAN UNIVERSITY 发明人 Ho Tuan-Shu;Tsai Chien-Chung;Hsu Kuang-Yu;Huang Sheng-Lung
分类号 G01B9/02;G01B11/06;G01N21/47 主分类号 G01B9/02
代理机构 CKC & Partners Co., Ltd. 代理人 CKC & Partners Co., Ltd.
主权项 1. A method for measuring characteristics of a sample, the method comprising: obtaining an interference spectrum of the sample, wherein the interference spectrum is measured by an interferometer, the interferometer includes a broadband light source, the light source emits a broadband spectrum with a shape similar to a shape of a Gaussian function; transforming the interference spectrum into a temporal interference signal via a Fourier transform, wherein the temporal interference signal includes a plurality of coherence wave packets; separating the wave packets; respectively transforming the separated wave packets into a plurality of interface interference signals via an inverse Fourier transform; and fitting a plurality of factors of the interface interference signals into a model for obtaining refractive indexes for different wavelengths, extinction coefficients for different wavelengths, and a thickness of the sample.
地址 Taipei TW