发明名称 |
Method for measuring characteristics of sample |
摘要 |
A method for measuring characteristics of a sample is provided. The method includes the following steps: obtaining an interference spectrum of the sample; transforming the interference spectrum into a temporal interference signal via a Fourier transform, in which the temporal interference signal includes a plurality of coherence wave packets; separating the wave packets; transforming the wave packets into a plurality of interface interference signals via an inverse Fourier transform; and fitting a plurality of factors of the interface interference signals into a model for obtaining the refractive indexes, the extinction coefficients, and a thickness of the sample. |
申请公布号 |
US9494410(B2) |
申请公布日期 |
2016.11.15 |
申请号 |
US201314097246 |
申请日期 |
2013.12.05 |
申请人 |
NATIONAL TAIWAN UNIVERSITY |
发明人 |
Ho Tuan-Shu;Tsai Chien-Chung;Hsu Kuang-Yu;Huang Sheng-Lung |
分类号 |
G01B9/02;G01B11/06;G01N21/47 |
主分类号 |
G01B9/02 |
代理机构 |
CKC & Partners Co., Ltd. |
代理人 |
CKC & Partners Co., Ltd. |
主权项 |
1. A method for measuring characteristics of a sample, the method comprising:
obtaining an interference spectrum of the sample, wherein the interference spectrum is measured by an interferometer, the interferometer includes a broadband light source, the light source emits a broadband spectrum with a shape similar to a shape of a Gaussian function; transforming the interference spectrum into a temporal interference signal via a Fourier transform, wherein the temporal interference signal includes a plurality of coherence wave packets; separating the wave packets; respectively transforming the separated wave packets into a plurality of interface interference signals via an inverse Fourier transform; and fitting a plurality of factors of the interface interference signals into a model for obtaining refractive indexes for different wavelengths, extinction coefficients for different wavelengths, and a thickness of the sample. |
地址 |
Taipei TW |