发明名称 Method of manufacturing split-gate memory
摘要 A method of manufacturing split-gate memory provides a control gate insulating film and the tunneling insulating film in a cell region, a high voltage gate insulating film in a high voltage region, and a low voltage gate insulating film in a low voltage region, all having different thickness. Additionally, a pre-cleaning process removes an outer sidewall portion of a spacer to form a tip portion of a floating gate that overlaps a control gate line formed proximate the floating gate.
申请公布号 US6977200(B2) 申请公布日期 2005.12.20
申请号 US20040982784 申请日期 2004.11.08
申请人 SAMSUNG ELECTRONICS CO., LTD. 发明人 KIM YONG-HEE;KWON CHUL-SOON;KIM JIN-WOO;KIM JOO-CHAN;KIM DAE-GEUN;RYU EUI-YOUL
分类号 H01L21/28;H01L21/336;H01L21/8247;H01L27/115;H01L29/788;H01L29/792;(IPC1-7):H01L21/336 主分类号 H01L21/28
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