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发明名称
TESTING METHOD OF ELECTRONIC PARTS
摘要
申请公布号
JPS536575(A)
申请公布日期
1978.01.21
申请号
JP19760081192
申请日期
1976.07.07
申请人
MITSUBISHI ELECTRIC CORP
发明人
OOTSUKI TEIJIROU
分类号
G01R31/26;G01N17/00
主分类号
G01R31/26
代理机构
代理人
主权项
地址
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